CP1503B Current probe

Description

GaN and SiC devices switch fast, and their gate-drive currents are small. Measuring both at once needs bandwidth and sensitivity. The CP1503B offers DC to 150 MHz, a rise time of ≤2.67 ns and a resolution of 1 mA.

Within the low-current family of Micsig's CP series, no model has a higher bandwidth. Clamp it around a conductor, connect it to your oscilloscope over BNC, and read the current without inserting a shunt.

What's inside

• 150 MHz, from DC: Top bandwidth among Micsig's low-current CP probes.
• Rise time of ≤2.67 ns: Keeps up with fast switching edges.
• Switchable ranges: 5 A at 1 V/1 A (1X), or 30 A at 1 V/10 A (10X).
• Up to 30 Arms continuous: Peak input up to 50 Apk.
• Down to 1 mA: 1 mA resolution, and 1 mA minimum measurable current on the 5 A range.
• Accurate to ±1% at DC: For static and DC current readings.
• Low noise: ≤400 μArms on the 5 A range, ≤120 μArms on the 30 A range.
• Compact 5 mm jaw: Fits around small conductors.
• Degauss/auto-zero and alarm: One button to zero the probe, plus an over-current alarm.
• BNC connection: According to Micsig, it works with oscilloscopes of any brand.

Why engineers choose it

• Keep up with GaN and SiC: The bandwidth and rise time are high enough for the fast current edges of wide-bandgap power devices.
• Weak signals stay visible: With 1 mA resolution and a low noise floor, small currents do not disappear into the noise.
• Transient and steady state together: Measuring from DC means you see the fast switching events and the static current on the same trace.
• Measure in place: No shunt resistor and no changes to the circuit under test.
• No new oscilloscope needed: Plug the BNC output into the scope already on your bench.
• Part of a wider Micsig setup: Combine it with the 500 A CP5005 and a Micsig high-resolution oscilloscope to cover everything from 1 mA to 500 Arms.

Where it's used

• Gate-drive current: Record fast gate-drive transients at up to 150 MHz. The 1 mA resolution also shows the static gate-drive current.
• Double-pulse tests on SiC and GaN: The CP1503B takes the gate-drive current, the CP5005 takes the device current. A Micsig MHO6 series oscilloscope with 12-bit sampling and a voltage probe records everything in sync for switching-loss analysis.
• SMPS development: Check inrush current and high-frequency ripple current in switching power supplies.
• Consumer electronics R&D: Measure inrush and ripple current during development. Use a CP5005 for power-stage currents above the CP1503B range.