DP high-voltage differential probes

The Micsig DP series is a range of high voltage differential probes specifically designed for precise measurements in demanding applications such as power electronics, motor control and high voltage testing. With bandwidths from 100 MHz to 500 MHz and the ability to measure differential voltages of up to 7000Vpk, the DP series is ideal for use in high frequency and high voltage environments. An outstanding feature of the DP series is the use of leading optical isolation technology, which ensures very low noise rejection and high common mode rejection ratio (CMRR). These features ensure high measurement accuracy, especially when capturing differential signals in high common mode voltage environments.

The DP series is versatile and ideal for applications such as switch mode power supply development, motor control testing, induction heating, inverters and other high frequency and high voltage applications. Despite its powerful specifications, the DP series is extremely compact. The probe head is only 2 cm thick and housed in a robust metal casing, which ensures high immunity to interference. In addition, the series offers simple operation with features such as automatic zeroing at the touch of a button and an overload warning, making it attractive for both professional users and less experienced users.

Equipped with a standard BNC interface, the DP series can be used with any oscilloscope, making it easy to integrate into existing measurement systems. Thanks to its outstanding amplitude-frequency characteristics and high input impedance, the DP series offers excellent signal accuracy, especially when analysing small signal changes in high-voltage environments. Overall, the Micsig DP series is a powerful and versatile solution for demanding high-voltage and high-frequency measurements that impresses with its compact dimensions, high precision and user-friendly operation. Whether in research and development or in industrial applications, the DP series delivers reliable and accurate measurement results for complex applications.