Micsig MOIP200P SigOFIT probe head

Description

The Micsig SigOFIT MOIP200P has a bandwidth of 200 MHz and a CMRR of 122 dB (at 200 MHz).

The Micsig Gen 3 SigOFIT series represents an advanced generation of optically isolated probes specifically designed to enable precise measurements in demanding high-frequency and high-voltage applications. Thanks to Micsig's innovative SigOFIT™ technology, these probes are characterised by outstanding common-mode rejection ratio (CMRR), high isolation voltage, improved temperature stability, and calibration-free operation. With a bandwidth of 200 MHz and a CMRR of up to 180 dB at DC and 122 dB at 200 MHz, the SigOFIT probes are ideally suited to accurately measure differential signals even in the presence of strong common-mode voltages.

Key Features and Functions

Optical Isolation Technology
SigOFIT probes use fibre-optic connections for optical isolation, providing complete electrical isolation between the measurement device (e.g. oscilloscope) and the test circuit. This significantly reduces the risk of interference from common-mode voltages while enabling safe measurements in high-voltage environments. The laser-powered optical architecture enables uninterrupted high-precision testing while maintaining exceptional signal integrity.

Improved Temperature Stability
The Gen 3 SigOFIT series delivers significantly improved temperature stability compared to previous generations. The advanced design eliminates temperature drift, ensuring consistent measurement accuracy during long-term testing and changing environmental conditions.

Calibration-Free Measurements
Unlike conventional differential probes, SigOFIT Gen 3 probes offer calibration-free measurements and require no auto-zero adjustment before use. This simplifies operation, reduces setup time, and improves workflow efficiency.

Versatile Applications
These probes are extremely versatile, whether in the development of motor drives, power converters, electronic ballasts, renewable energy systems, EV power electronics, or the analysis of modern GaN and SiC semiconductor devices. They are also ideal for safety testing in high-voltage and high-frequency environments.

High Measurement Accuracy
With a DC gain accuracy better than 1% and noise suppression of less than 0.3 mV RMS, the SigOFIT probes provide exceptional precision, enabling even the smallest signal details to be reliably captured and analysed.

Flexible Attenuation and Wide Measurement Range
The SigOFIT series supports a variety of interchangeable attenuators with attenuation ratios ranging from 10:1 to 10,000:1. Depending on the selected attenuator, differential measurements can be performed from ±0.01 V up to ±20 kV. The measurement voltage range can also be customised to suit specific application requirements.

For low-voltage applications, the probe can be used without an attenuation tip by connecting directly via an SMA adapter. In this configuration, the probe provides an integrated 2:1 attenuation ratio, making it ideal for accurate small-signal measurements.

Customisable Fibre Length
The standard fibre-optic cable length is 2 metres. Custom fibre lengths are available on request for specialised laboratory, industrial, and production test environments.

Compact and Robust Design
Despite their advanced technology, SigOFIT probes are compact and robust in design, making them ideal for use in laboratories as well as demanding industrial environments.

The SigOFIT Gen 3 series is designed to meet the highest safety standards and provide users with a reliable and secure measurement environment, especially in high-voltage and high-frequency applications. Its combination of optical isolation, industry-leading CMRR performance, calibration-free operation, temperature-stable measurements, and an exceptionally wide measurement range makes it the ideal choice for critical and demanding measurement tasks.