Micsig MOIP350P SigOFIT probe head

Description

The Micsig SigOFIT series represents an advanced generation of optically isolated probes specifically designed to enable precise measurements in demanding high-frequency and high-voltage applications. Thanks to Micsig's innovative SigOFIT™ technology, these probes are characterised by outstanding common mode rejection ratio (CMRR) and high isolation voltage. With a bandwidth of up to 1 GHz and a CMRR of up to 180 dB at DC and 108 dB at 1 GHz, the SigOFIT probes are ideally suited to accurately measure differential signals even in the presence of strong common mode voltages.

Key features and functions:

Optical isolation technology: SigOFIT probes use fibre optic connections for optical isolation, providing complete electrical isolation between the measurement device (e.g. oscilloscope) and the test circuit. This significantly reduces the risk of interference from common-mode voltages while enabling safe measurements in high-voltage environments.

Versatile applications: These probes are extremely versatile, whether in the development of motor drives, in work with power converters and electronic ballasts or in the analysis of modern GaN and SiC semiconductor components. They are also ideal for safety tests in high-voltage and high-frequency environments.

High measurement accuracy: With a gain accuracy of 1 % at DC and a noise suppression of less than 450 µV RMS, the SigOFIT probes offer exceptional precision, enabling even the smallest signal details to be reliably captured and analysed.

Customisable attenuation: The SigOFIT series is equipped with various attenuation peaks that cover attenuation ratios from 10:1 to 10,000:1. This allows differential voltages from ±0.01 V to ±6250 V to be measured. In addition, the gain function can amplify the signal by a factor of 10, giving each attenuation peak two attenuation ranges. However, it is important to note that gain can also amplify interference and noise.

Fast calibration and ease of use: The SigOFIT series probes offer an automatic calibration function that is completed in less than a second and does not require disconnection of the test circuit. This makes repeated measurements particularly efficient and simple.

Compact and robust design: Despite their advanced technology, SigOFIT probes are compact and robust in design, making them ideal for use in laboratories as well as in demanding industrial environments.

The SigOFIT series is designed to meet the highest safety standards and provide users with a reliable and safe measurement environment, especially in high-voltage and high-frequency applications. These features make the SigOFIT probes the optimal choice for critical and demanding measurement tasks.