Micsig MOIP350P SigOFIT probe head

Description

The Micsig SigOFIT MOIP350P has a bandwidth of 350 MHz and a CMRR of 118 dB (at 350 MHz).

The Micsig SigOFIT Gen 3 series represents an advanced generation of optically isolated probes specifically designed to enable precise measurements in demanding high-frequency and high-voltage applications. Thanks to Micsig's innovative SigOFIT™ technology, these probes are characterised by outstanding common-mode rejection ratio (CMRR), high isolation voltage, and exceptional measurement stability. With a bandwidth of up to 350 MHz and a CMRR of up to 180 dB at DC and 118 dB at 350 MHz, the SigOFIT probes are ideally suited for accurately measuring differential signals even in the presence of strong common-mode voltages.

Key Features and Functions

Optical isolation technology
SigOFIT probes use fibre-optic connections for complete electrical isolation between the measurement device (e.g. oscilloscope) and the test circuit. This significantly reduces interference from common-mode voltages while enabling safe measurements in high-voltage environments.

Improved temperature stability
The latest generation of SigOFIT probes features enhanced temperature stability, ensuring highly consistent measurement performance across varying operating conditions. The design eliminates temperature drift, providing reliable long-term measurement accuracy.

Calibration-free operation
Unlike conventional differential probes, the SigOFIT Gen 3 series enables calibration-free measurements and does not require auto-zero adjustment before use. This reduces setup time and improves measurement efficiency in both laboratory and production environments.

Laser-powered technology
The SigOFIT probe is powered through advanced laser-based optical transmission technology, enabling uninterrupted high-precision testing while maintaining complete galvanic isolation between the measurement circuit and the oscilloscope.

Versatile applications
These probes are extremely versatile, whether in the development of motor drives, power converters, electronic ballasts, renewable energy systems, EV power electronics, or the analysis of modern GaN and SiC semiconductor devices. They are also ideal for safety testing in high-voltage and high-frequency environments.

High measurement accuracy
With a gain accuracy of 1% at DC and noise suppression below 0.3 mV RMS, the SigOFIT probes deliver exceptional precision, allowing even the smallest signal details to be reliably captured and analysed.

Flexible attenuation and wide measurement range
The SigOFIT series supports a range of interchangeable attenuators, covering attenuation ratios from 10:1 to 10,000:1. This enables differential measurements from ±0.01 V up to ±20 kV, depending on the selected attenuator and application requirements. The measurement range can also be customised for specific testing needs.

In addition, the probe can now be used without an attenuation tip by connecting directly via an SMA adapter for small-signal measurements. In this configuration, the probe provides an internal attenuation ratio of 2:1, making it suitable for low-voltage and high-precision signal analysis.

Customisable fibre length
The standard fibre-optic cable length is 2 m, with custom fibre lengths available upon request for specialised test setups and installation requirements.

Compact and robust design
Despite their advanced technology, SigOFIT probes are compact and robust in design, making them ideal for use in laboratories as well as demanding industrial environments.

The SigOFIT series is designed to meet the highest safety standards and provide users with a reliable and secure measurement environment, especially in high-voltage and high-frequency applications. With optical isolation, exceptional CMRR performance, calibration-free operation, improved temperature stability, and a wide measurement range, SigOFIT probes are the ideal choice for critical and demanding measurement tasks.