Micsig MOIP500P SigOFIT probe head
€8,999.00 Net
€10,708.81 incl. VAT
Delivery time: 1-2 weeks
Delivery time: 1-2 weeks
Features
- Bandwidth 500 MHz
- rise time ≤800ps
- accuracy < 1%
- CMRR: 114dB (500MHz)
- Demo device available: Would you like to test the device? Ask us, we offer you the opportunity to test the device for up to 2 weeks.
Description
The Micsig SigOFIT Gen 3 MOIP500P has a bandwidth of 500 MHz and a CMRR of 114 dB (at 500 MHz).
The Micsig SigOFIT series represents an advanced generation of optically isolated probes specifically designed to enable precise measurements in demanding high-frequency and high-voltage applications. Thanks to Micsig's innovative SigOFIT™ technology, these probes are characterised by outstanding common-mode rejection ratio (CMRR), high isolation voltage, and exceptional measurement stability. With a bandwidth of up to 500 MHz and a CMRR of up to 180 dB at DC and 114 dB at 500 MHz, the SigOFIT probes are ideally suited for accurately measuring differential signals, even in the presence of strong common-mode voltages.
Key Features and Functions
Optical isolation technology
SigOFIT probes use fibre-optic connections for complete electrical isolation between the measurement device (e.g. oscilloscope) and the test circuit. This significantly reduces interference from common-mode voltages while enabling safe measurements in high-voltage environments.
Improved temperature stability and drift-free operation
The third-generation SigOFIT probes feature significantly improved temperature stability, eliminating temperature drift during measurements. This ensures consistent accuracy over extended operating periods and in changing environmental conditions.
Calibration-free measurements
Unlike conventional differential probes, SigOFIT Gen 3 technology does not require auto-zero procedures or frequent recalibration. Users benefit from faster setup times, greater convenience, and more reliable measurement results.
Laser-powered optical transmission
The laser-powered optical transmission system enables uninterrupted high-precision testing by maintaining stable signal integrity and complete galvanic isolation throughout the measurement process.
High measurement accuracy
With a gain accuracy of 1% at DC and noise suppression below 0.3 mV RMS, the SigOFIT probes provide exceptional precision, allowing even the smallest signal details to be captured and analysed reliably.
Flexible attenuation and wide measurement range
The SigOFIT series supports a variety of attenuators, enabling measurements from ±0.01 V up to ±20 kV differential-mode signals. The measurement range can also be customised to meet specific application requirements. Available attenuation ratios range from 10:1 to 10,000:1, providing outstanding flexibility across low-voltage and high-voltage applications.
Versatile applications
These probes are ideal for motor drives, power converters, electronic ballasts, renewable energy systems, EV power electronics, battery management systems, and the analysis of advanced GaN and SiC semiconductor devices. They are also well suited for safety testing in high-voltage and high-frequency environments.
Fast setup and ease of use
Thanks to their calibration-free architecture and elimination of auto-zero requirements, SigOFIT probes are ready for accurate measurements immediately, improving workflow efficiency in both laboratory and production environments.
Customisable fibre length
The standard fibre-optic cable length is 2 metres, with custom fibre lengths available for specialised testing environments and installation requirements.
Compact and robust design
Despite their advanced technology, SigOFIT probes feature a compact and durable design, making them suitable for laboratory use as well as demanding industrial applications.
The SigOFIT series is engineered to meet the highest safety standards while providing users with a reliable and secure measurement environment for high-voltage and high-frequency applications. Its combination of optical isolation, exceptional CMRR, calibration-free operation, temperature stability, and wide voltage measurement capability makes the SigOFIT Gen 3 series an ideal choice for the most demanding measurement tasks.
Features
Further information

CMRR
The SigOFIT probe has a high common mode rejection ratio (CMRR) of up to 114dB at 500MHz.

GaN suitable
The Micsig SigOFIT probes were developed specifically for GaN and similar applications. To meet the high requirements, the measuring leads are short and the input capacitance is less than 3pF input capacitance.

High accuracy
The SigOFIT probe has excellent amplitude-frequency characteristics and the accuracy of the DC gain is better than 1 %. The maximum noise floor within the range is <0.3mVrms, and the zero drift is <0.1%.

For third generation semiconductors
SiC and GaN devices can switch high voltages in a few nanoseconds and the signal can exhibit high-energy, high-frequency harmonics.
Specifications
| Model comparison | MOIP100P | MOIP200P | MOIP350P | MOIP500P | MOIP800P | MOIP1000P |
|---|---|---|---|---|---|---|
| Bandwidth | 100 MHz | 200 MHz | 350 MHz | 500 MHz | 800 MHz | 1GHz |
| Rise time | ≤3.5 ns | ≤1.5ns | ≤1ns | ≤800ps | ≤438ps | ≤450ps |
| SMA input impedance | 1MΩ; || 10pF | 1MΩ; || 10pF | 1MΩ; || 10pF | 1MΩ; || 10pF | 1MΩ; || 10pF | 1MΩ; || 10pF |
| Output voltage | ±1,25V | ±1,25V | ±0,5V | ±0,5V | ±0,5V | ±0,5V |
| Differential voltage ranges | 20X: ±25V 50X: ±62.5V 200X: ±250 V1000X: ±1250V 2000X: ±2500V 5000X: ±6250V | 20X: ±10V 50X: ±25V 100X: ±50 V1000X: ±500V 2000X: ±1000V 5000X: ±2500V | 20X: ±10V 50X: ±25V 100X: ±50V 1000X: ±500V 2000X: ±1000V 5000X: ±2500V | 20X: ±10V 50X: ±25V 100X: ±50V1000X: ±500V 2000X: ±1000V 5000X: ±2500V 10000X: ±5000V | 20X: ±10V 50X: ±25V 1000X: ±500V 2000X: ±1000V 5000X: ±2500V 10000X: ±5000V | 20X: ±10V 50X: ±25V 1000X: ±500V 2000X: ±1000V 5000X: ±2500V 10000X: ±5000V |
| Noise | <450μVrms | <0.3mVrms | <0.3mVrms | <0.3mVrms | <450μVrms | <0.3mVrms |
| Propagation delay | 15.42 ns (2 m cable length) | 15.42 ns (2 m cable length) | 15.42 ns (2 m cable length) | 15.42 ns (2 m cable length) | 15.42 ns (2 m cable length) | 15.42 ns (2 m cable length) |
| Power supply | USB type-C, DC: 12 V | USB Type-C, DC: 12 V | USB Type-C, DC: 12 V | USB Type-C, DC: 12 V | USB Type-C, DC: 12 V | USB Type-C, DC: 12 V |
| DC amplification accuracy | 1 % | 1 % | 1 % | 1 % | 1 % | 1 % |
| Common mode voltage range | 60kVpk | 85kVpk | 85kVpk | 85kVpk | 60kVpk | 85kVpk |
| CableLength | 2 M (Std.) (customisable) | 2 M (Std.) (customisable) | 2 M (Std.) (customisable) | 2 M (hrs.) (customisable) | 2 M (hrs.) (customisable) | 2 M (Hrs) (customisable) |
Specification attenuators
| Probe tip | Attenuation | Differential voltage range (MOIP100P/200P/350P) | Differential voltage range (MOIP500P) | Differential voltage range (800P/1000P) | Input impedance |
|---|---|---|---|---|---|
| OP20 | 2X/20X | ±1V / ±10V | ±1V / ±10V | ±1V / ±10V | 4.47MΩ || ≤ 4pF |
| OP50 | 5X/50X | ±2.5V / ±25V | ±2.5V / ±25V | ±2.5V / ±25V | 4.19MΩ || ≤ 2pF |
| OP100 | 10X/100X | ±5V / ±50V | ±5V / ±50V | ±5V / ±50V | 4.10MΩ || ≤ 2pF |
| OP1000 | 100X/1000X | ±50V / ±500V | ±50V / ±500V | ± 50V / ± 500V | 20.94MΩ || ≤ 1pF |
| OP2000 | 200X/2000X | ± 100V / ± 1000V | ± 100V / ± 1000V | ± 100V / ± 1000V | 20.52MΩ || ≤ 1pF |
| OP5000 | 500X/5000X | ± 250V / ± 2500V | ± 250V / ± 2500V | ± 250V / ± 2500V | 40.82MΩ || ≤1pF |
| OP10000 | 1000X/10000X | ± 500V / ± 5000V | ± 500V / ± 5000V | ± 500V / ± 5000V | 40.82MΩ || ≤ 1pF |

















